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Universal X-Ray Coating Thickness Measurement And Material Analysis System

Universal X-Ray Coating Thickness Measurement And Material Analysis System

Product Category :    Electronic Testing And Measuring Instruments

Supplier                :    Quantum Equipment Co. Ltd.

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Product Profile of Universal X-ray Coating Thickness Measurement And Material Analysis System

Quantum Equipment Co. Ltd. Offers Universal X-Ray Coating Thickness Measurement and Material Analysis System. Universal X-Ray Coating Thickness System is a device used for elemental analysis, thickness measurements, on-line inspection, quality control applications and percentage determination of precious metals through micro spot X-ray tube technology. This Universal X-Ray Coating Thickness Measurement and Material Analysis System is available as `ComPact 5` and is designed for the inspection of electronic components, PCB`s and other precision metal finishing applications. It is an excellent choice when coating thickness measurement and material analysis applications demand high precision and versatility. Quantum Equipment Co. Ltd. Is an ISO 9001:2000 certified company.

Coating thickness and alloy composition can be analyzed simultaneously. The Universal X-Ray Coating Thickness Measurement and Material Analysis System can also determine primary metals concentration in plating bath solutions and perform substrate sorting of pre-plated stock. The programmable XYZ sample stage configuration facilitates automatic measurement sequences, making the Universal X-Ray Coating Thickness Measurement and Material Analysis System an ideal tool for the electronics and telecommunication industries for precision metal finishing applications.

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